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Application of Scanning Microwave Microscopy nano-C-V to investigate dopant defect under a poly gate device.
Oskar Amster
K. A. Rubin
Y. Yang
D. Iyer
Arron Messinger
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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nano scale
decision support
image analysis
database
real time
data sets
real world
information retrieval
computer vision
information systems
video sequences
machine vision
structured light