A 16nm dual-port SRAM with partial suppressed word-line, dummy read recovery and negative bit-line circuitries for low VMIN applications.
Yen-Huei ChenKao-Cheng LinChing-Wei WuWei-Min ChanJhon-Jhy LiawHung-Jen LiaoJonathan ChangPublished in: VLSI Circuits (2016)