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A 16nm dual-port SRAM with partial suppressed word-line, dummy read recovery and negative bit-line circuitries for low VMIN applications.

Yen-Huei ChenKao-Cheng LinChing-Wei WuWei-Min ChanJhon-Jhy LiawHung-Jen LiaoJonathan Chang
Published in: VLSI Circuits (2016)
Keyphrases
  • line segments
  • positive and negative
  • random access memory