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A 900 Mbps single-channel capacitive I/O link for wireless wafer-level testing of integrated circuits.

Dae Young LeeDavid D. WentzloffJohn P. Hayes
Published in: A-SSCC (2011)
Keyphrases
  • integrated circuit
  • single channel
  • multi channel
  • wireless networks
  • electron beam
  • wireless communication
  • multiscale