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Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons.
Kazusa Takami
Yuibi Gomi
Shin-ichiro Abe
Wang Liao
Seiya Manabe
Tetsuro Matsumoto
Masanori Hashimoto
Published in:
IRPS (2023)
Keyphrases
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cross sections
cross sectional
cross section
delaunay triangulation
computer vision
electron micrographs
medical images
tubular objects