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Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons.

Kazusa TakamiYuibi GomiShin-ichiro AbeWang LiaoSeiya ManabeTetsuro MatsumotoMasanori Hashimoto
Published in: IRPS (2023)
Keyphrases
  • cross sections
  • cross sectional
  • cross section
  • delaunay triangulation
  • computer vision
  • electron micrographs
  • medical images
  • tubular objects