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A compact on-chip IR-drop measurement system in 28 nm CMOS technology.
Sebastian Dietel
Sebastian Höppner
Holger Eisenreich
Georg Ellguth
Stefan Hänzsche
Stephan Henker
René Schüffny
Tim Brauninger
Ulrich Fiedler
Published in:
ISCAS (2014)
Keyphrases
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cmos technology
low power
spl times
power consumption
low voltage
parallel processing
power dissipation
image sensor
high speed
low cost
mixed signal
silicon on insulator
real time
dynamic range
embedded dram