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Ka-band InP high electron mobility transistor monolithic microwave integrated circuit reliability.

Bruce M. PaineRichard C. WongAdele E. SchmitzRobert H. WaldenLoi D. NguyenMichael J. DelaneyKenny C. Hum
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • integrated circuit
  • electron beam
  • frequency band
  • high reliability
  • hardware description language
  • neural network
  • steady state
  • printed circuit boards