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Automatic image segmentation for material microstructure characterization by optical microscopy.
Naim Ramou
Nabil Chetih
Yamina Boutiche
Rabah Abdelkader
Published in:
Informatica (Slovenia) (2020)
Keyphrases
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mechanical properties
material properties
image analysis
high throughput
charge coupled device
data sets
neural network
solid state
high resolution
image enhancement
finite element
optical imaging
optical fiber
font recognition
image stacks