Adaptive three-dimensional wavelet analysis for denoising TOF-SIMS images: Toward digital staining of pathological specimens.
K. TanjiManabu KomatsuHiroyuki HashimotoPublished in: BMEI (2011)
Keyphrases
- three dimensional
- wavelet analysis
- denoising
- wavelet denoising
- image analysis
- gaussian noise
- image data
- input image
- depth map
- object recognition
- d objects
- wavelet transform
- region of interest
- image processing
- wavelet shrinkage
- image sequences
- factor analysis
- feature detection
- low frequency
- noisy images
- cluster analysis
- image denoising
- keypoints
- video sequences
- image features