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Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM.
Daniel Kraak
Mottaqiallah Taouil
Innocent Agbo
Said Hamdioui
Pieter Weckx
Stefan Cosemans
Francky Catthoor
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
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information retrieval
artificial neural networks
database
artificial intelligence
multiscale
quantitative analysis
real world
computer vision
database systems
multi agent systems
image analysis
infrared
data acquisition