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ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited.
Yoon Huh
Peter Bendix
Kyungjin Min
Jau-Wen Chen
Ravindra Narayan
Larry D. Johnson
Steven H. Voldman
Published in:
IWSOC (2005)
Keyphrases
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failure modes
hardware and software
hardware software partitioning
embedded systems
design space exploration
fault tree
power consumption
computer systems
hardware software
low power
internal and external
feature analysis
design space
researchers and practitioners
design issues
internal states
low cost