Accurate, fast, and robust centre localisation for images of semiconductor components.
Fabian TimmErhardt BarthPublished in: Image Processing: Machine Vision Applications (2011)
Keyphrases
- image data
- input image
- image database
- image noise
- robust segmentation
- highly accurate
- image features
- image retrieval
- computationally efficient
- image classification
- image analysis
- image regions
- multiple images
- three dimensional
- image collections
- completely automated
- rigid body
- image set
- partial occlusion
- image matching
- segmentation method
- image annotation
- region of interest
- illumination conditions
- test images
- feature descriptors
- image registration
- subpixel accuracy
- ground truth
- geometric transformations
- geometric distortions
- completely automatic
- multiresolution
- global image statistics