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Binary Pattern for Nested Cardinality Constraints for Software Product Line of IoT-Based Feature Models.

Asad AbbasIsma Farah SiddiquiScott Uk-Jin LeeAli Kashif Bashir
Published in: IEEE Access (2017)
Keyphrases
  • cardinality constraints
  • software product line
  • binary patterns
  • probabilistic model
  • product line
  • artificial intelligence
  • face recognition
  • feature set
  • gray scale
  • binary images