DPSC SRAM Transparent Test Algorithm.
Hong-Sik KimSungho KangPublished in: Asian Test Symposium (2002)
Keyphrases
- preprocessing
- improved algorithm
- dynamic programming
- optimal solution
- computational complexity
- computational cost
- simulated annealing
- worst case
- matching algorithm
- clustering method
- detection algorithm
- high accuracy
- probabilistic model
- objective function
- recognition algorithm
- expectation maximization
- computationally efficient
- optimization algorithm
- selection algorithm
- search space
- classification algorithm
- input data
- convergence rate
- times faster
- path planning
- learning algorithm
- k means
- similarity measure