MPC in high-speed atomic force microscopy.

M. S. Rana Hemanshu Roy Pota Ian R. Petersen

Published in: AuCC (2016)

Keyphrases

atomic force microscopy
high speed
low power
closed loop
real time
dynamic model
data mining
search algorithm
special case
frame rate
database
artificial intelligence
decision trees
management system
feedback control
high speed networks