3.65-mW 7-Bit 2-GS/s Single-Channel GRO-Based Time-Domain ADC Incorporating Dead-Zone Elimination and On-Chip Folding-Offset Calibration in 28-nm CMOS.
Chenghao ZhangJiangbo WeiYong ChenMaliang LiuYintang YangPublished in: IEEE J. Solid State Circuits (2023)
Keyphrases
- single channel
- analog to digital converter
- multi channel
- mixed signal
- nm technology
- power consumption
- frequency domain
- low power
- cmos technology
- dead zone
- single chip
- nonlinear systems
- power dissipation
- independent component analysis
- cmos image sensor
- weight update
- spatial domain
- image sensor
- signal processing
- random access memory
- denoising
- wiener filter
- wavelet decomposition