Login / Signup
Automated Selection of Assertions for Bit-Flip Detection During Post-Silicon Validation.
Pouya Taatizadeh
Nicola Nicolici
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
</>
automated analysis
detection algorithm
detection method
detection accuracy
low cost
false positives
false alarms
anomaly detection
semi automated
selection strategy
detection rate
detection scheme
object detection
case study
information systems
database
selection criteria
high speed
feature selection
data mining