Improving wafer map classification in Industry 4.0.
Michael ScheiberClement NarteyAnja ZernigAndre KästnerPublished in: ICPS (2022)
Keyphrases
- pattern classification
- case study
- classification models
- pattern recognition
- classification accuracy
- support vector
- classification algorithm
- classification process
- model selection
- text classification
- image classification
- automatic classification
- feature extraction
- decision trees
- machine learning
- decision rules
- cross validation
- training samples
- support vector machine svm
- supervised learning
- classification scheme
- feature selection
- machine learning methods
- data sets
- feature maps
- svm classifier
- class labels
- benchmark datasets
- text categorization
- unsupervised learning
- multi class
- support vector machine
- control system
- pairwise
- feature space
- data mining