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Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation.

Achiranshu GargZhao Chuan LeeLu LuTony Tae-Hyoung Kim
Published in: Microelectron. J. (2019)
Keyphrases
  • software aging
  • power consumption
  • databases
  • data structure
  • neural network
  • database systems
  • high speed
  • data transmission
  • highly reliable
  • age estimation