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SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).

Konstantin O. PetrosyantsLev M. SamburskyMaxim V. KozhukhovMamed R. Ismail-ZadeIgor A. KharitonovBo Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)
Keyphrases
  • wide range
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  • data sets
  • three dimensional
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  • database
  • wireless sensor networks
  • numerical simulations
  • range scans