Design and analysis of a 32 nm PVT tolerant CMOS SRAM cell for low leakage and high stability.

Sheng Lin Yong-Bin Kim Fabrizio Lombardi

Published in: Integr. (2010)

Keyphrases

power consumption
low power consumption
low cost
cmos technology
low power
statistical analysis
circuit design
neural network
case study
image analysis
wide range
data analysis
single chip
manufacturing cell
nm technology