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Gate leakage-current analysis and modelling of planar and trench power SiC MOSFET devices in extreme short-circuit operation.

F. BoigeFrédéric Richardeau
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • short circuit
  • genetic algorithm
  • evolutionary algorithm
  • power consumption
  • thin film
  • leakage current