Special issue: Statistical techniques in pattern recognition.
Pavel PudilPublished in: Kybernetika (1998)
Keyphrases
- special issue
- pattern recognition
- international journal
- ecml pkdd
- ai edam
- neural network
- machine learning
- applied intelligence
- computer vision
- statistical models
- special section
- signal processing
- statistical analysis
- pattern recognition problems
- dimensionality reduction
- fuzzy sets
- image analysis
- image processing
- information theoretic
- artificial intelligence
- multimedia
- feature extraction
- statistical methods
- data driven
- rough sets