Characterization of CMOS Defects using Transient Signal Analysis.

James F. Plusquellic Donald M. Chiarulli Steven P. Levitan

Published in: DFT (1998)

Keyphrases

signal analysis
multiresolution
signal processing
empirical mode decomposition
adaptive learning
high speed
wavelet decomposition
median filter
feature extraction
lifting scheme
non stationary
gray scale
independent component analysis
filter bank
computer vision
bit rate
wavelet transform
face recognition