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Plasma processing induced charging damage (PID) assessment with appropriate fWLR stress methods ensuring expected MOS reliability and lifetimes for automotive products (Invited).

Andreas Martin
Published in: IRPS (2022)
Keyphrases
  • empirical studies
  • real time
  • machine learning
  • learning algorithm
  • query processing
  • control system
  • significant improvement
  • fuzzy logic
  • benchmark datasets
  • machine learning methods