DFB Laser Chip Defect Detection Based on Successive Subspace Learning.
Dennis HouTuo LiuXiaobin ZhangYuxi WangYen-Ting PanJanpu HouPublished in: CCWC (2020)
Keyphrases
- subspace learning
- defect detection
- dimensionality reduction
- manifold learning
- feature extraction
- low dimensional
- principal component analysis
- data representation
- sparse representation
- sparse coding
- face recognition
- semi supervised
- high dimensional data
- maximum margin criterion
- linear subspace
- natural images
- subspace learning algorithm
- high dimensional
- data mining
- fisher criterion
- neural network