A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS.
NamHyuk YangJinHwan KimGeonGu ParkChulHyuk KwonSeungTaek LeeSangWoo PaeHooSung KimSangWon HwangPublished in: IRPS (2021)
Keyphrases
- objective function
- high precision
- significant improvement
- computational cost
- high accuracy
- study proposes
- regression analysis
- preprocessing
- experimental study
- neural network
- detection method
- mutual information
- pixel level
- matching algorithm
- synthetic data
- detection algorithm
- empirical studies
- model selection
- level set
- edge detection
- dynamic programming
- prior knowledge
- pairwise
- computational complexity
- similarity measure
- decision trees