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The negative bias temperature instability in MOS devices: A review.

James H. StathisSufi Zafar
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • mobile devices
  • positive and negative
  • low cost
  • literature review
  • machine learning
  • decision trees
  • embedded systems
  • mobile applications
  • personal computer
  • smart phones
  • room temperature
  • surface temperature