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Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology.

Hsin-Chieh ChenWei-Chung ChenYing-Wei ChouMeng-Wei ChienChin-Long WeyKe-Horng ChenYing-Hsi LinTsung-Yen TsaiChao-Cheng Lee
Published in: CICC (2014)
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