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Failure mode analysis of GaN-HEMT under high temperature operation.

Yasuyo KurachiHiroshi YamamotoYukinori NoseSatoshi ShimizuYasunori TatenoTakumi YonemuraMasato Furukawa
Published in: IRPS (2018)
Keyphrases
  • high temperature
  • neural network
  • bayesian networks
  • data sets
  • video sequences
  • data analysis
  • expert systems