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Statistical Test Development for Analog Circuits Under High Process Variations.

Fang LiuSule Ozev
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
  • statistical tests
  • analog circuits
  • software engineering
  • neural network
  • machine learning
  • decision making
  • statistical analysis
  • machine learning algorithms
  • statistical methods