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Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs using multiple secondary MIS gates.

Lars HeukenMuhammad AlshahedAlessandro OttavianiMohammed AlomariJoachim N. BurghartzUlrike WaizmannThomas Reindl
Published in: ESSDERC (2018)
Keyphrases
  • data analysis
  • vector field
  • decision making
  • image sequences
  • viewpoint
  • image analysis
  • decision support system
  • statistical analysis