A pattern recognition experiment with near-optimum results.
Charles A. RosenDavid J. HallPublished in: IEEE Trans. Electron. Comput. (1966)
Keyphrases
- pattern recognition
- image processing
- signal processing
- neural network
- machine learning
- pattern recognition problems
- image analysis
- pattern classification
- computer vision
- information retrieval
- image recognition
- dimensionality reduction
- pattern analysis
- feature extraction
- support vector machine svm
- rough sets
- computational complexity
- global optimum
- control parameters
- optimum design
- pattern representation