Advances and Overcoming Challenges in Tomographic Diffractive Microscopy.
Bertrand SimonNicolas VerrierMatthieu DebailleulOlivier HaeberléPublished in: ICTON (2023)
Keyphrases
- current challenges
- electron microscopy
- lessons learned
- artificial intelligence
- open issues
- image analysis
- high throughput
- computer vision
- technical challenges
- key issues
- recent advances
- data sets
- image reconstruction
- information technology
- future directions
- pattern recognition
- website
- information systems
- data mining
- tomographic reconstruction
- databases