Noise Generation and Coupling Mechanisms in Deep-Submicron ICs.
Xavier AragonèsJosé Luis GonzálezFrancesc MollAntonio RubioPublished in: IEEE Des. Test Comput. (2002)
Keyphrases
- additive noise
- noisy data
- random noise
- noise level
- neural network
- noise reduction
- noise model
- low signal to noise ratio
- noise sensitivity
- x ray
- high resolution
- signal to noise ratio
- computational models
- information systems
- artificial intelligence
- data sets
- background noise
- measurement noise
- sensor noise
- mechanisms underlying
- vlsi circuits