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Improving student performance using automated testing of simulated digital logic circuits.

Zachary Kurmas
Published in: ITiCSE (2008)
Keyphrases
  • logic circuits
  • low power
  • tunnel diode
  • functional decomposition
  • gate array
  • pattern recognition
  • low cost
  • neural network
  • image processing
  • high speed
  • power consumption
  • logic synthesis