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Capacitance pin defect detection based on deep learning.
Cheng Cheng
Ning Dai
Jie Huang
Yahong Zhuang
Tao Tang
Longlong Liu
Published in:
J. Comb. Optim. (2022)
Keyphrases
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defect detection
deep learning
unsupervised learning
unsupervised feature learning
feature extraction
machine learning
deep architectures
mental models
weakly supervised
pattern recognition
feature space
domain specific