Capacitance pin defect detection based on deep learning.

Cheng Cheng Ning Dai Jie Huang Yahong Zhuang Tao Tang Longlong Liu

Published in: J. Comb. Optim. (2022)

Keyphrases

defect detection
deep learning
unsupervised learning
unsupervised feature learning
feature extraction
machine learning
deep architectures
mental models
weakly supervised
pattern recognition
feature space
domain specific