Prediction of Package Chip Quality Using Fail Bit Count Data of the Probe Test.
Jin Soo ParkSeoung Bum KimPublished in: IEA/AIE (2015)
Keyphrases
- high quality
- data quality
- data sets
- synthetic data
- original data
- data analysis
- data sources
- knowledge discovery
- missing data
- data collection
- prediction model
- spatial data
- prediction accuracy
- database
- data structure
- database systems
- neural network
- input data
- computer systems
- data mining techniques
- data management
- image data
- sensor data
- experimental data
- test data
- face recognition
- statistical significance
- data transfer