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Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array.

Minoru WatanabeMakoto Inami KobayashiMitsutaka IsobeKunihiro OgawaShigeo MatsuyamaMisako Miwa
Published in: ICCE (2024)
Keyphrases
  • error tolerance
  • gate array
  • low power
  • low cost
  • logic circuits
  • x ray
  • hardware implementation
  • high speed
  • upper bound