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Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy.

Christopher Hardly JosephGiovanni CapocciaAndrea LucibelloEmanuela ProiettiGiovanni Maria SardiGiancarlo BartolucciRomolo Marcelli
Published in: Sensors (2023)
Keyphrases
  • dynamic environments
  • high speed
  • integrated circuit
  • image analysis
  • neural network
  • computer vision
  • high density