An Optimal Approach for Random Signals Classification.
Christian DoncarliEric Le CarpentierPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (1991)
Keyphrases
- pattern recognition
- classification accuracy
- machine learning
- feature vectors
- feature space
- image classification
- support vector machine
- training set
- cross validation
- feature selection
- benchmark datasets
- class labels
- pattern classification
- training samples
- unsupervised learning
- classification scheme
- cross validated
- eeg signals
- worst case
- dynamic programming
- sleep stage
- feature extraction
- classification systems
- binary decision tree
- randomized trees
- feature subset
- independent component analysis
- classification algorithm
- decision rules
- svm classifier
- model selection
- text classification
- signal processing
- supervised learning
- multi class
- optimal solution
- image processing