Login / Signup

A cryogenic single electron transistor readout circuit: Practical issues and measurement considerations.

Kushal DasTorsten Lehmann
Published in: ISCAS (2012)
Keyphrases
  • practical issues
  • high speed
  • circuit design
  • expert systems
  • artificial neural networks
  • real time
  • neural network
  • image processing
  • relational databases
  • fault diagnosis
  • low power
  • high energy
  • van der waals