A Novel Monitoring Method of RF Characteristics Variations for Sub-0.1μm MOSFETs with Precise Gate-resistance Model.
Akira TanabeKen'ichiro HijiokaYoshihiro HayashiPublished in: CICC (2006)
Keyphrases
- mathematical model
- cost function
- prior knowledge
- statistical model
- prior information
- test data
- probabilistic model
- objective function
- markov model
- regression analysis
- monte carlo simulation
- evaluation method
- recognition algorithm
- study proposes
- modeling method
- theoretical analysis
- network model
- analytical model
- significant improvement
- classification algorithm
- sensitivity analysis
- closed form
- real time
- similarity measure
- prediction model
- hybrid method
- kalman filter
- optimization model
- monitoring system
- dynamic programming
- input data
- optimization method
- high order
- computational model
- bp neural network
- gaussian distribution
- probability distribution
- parameter estimation
- high accuracy
- spatial structure
- autoregressive
- hybrid model
- parameter space
- clustering method
- segmentation algorithm
- k means
- preprocessing
- computational complexity
- face recognition