Nonparametric Bayes Risk Estimation for Pattern Classification.
Zen ChenKing-Sun FuPublished in: IEEE Trans. Syst. Man Cybern. (1977)
Keyphrases
- pattern classification
- parzen window
- bayes risk
- loss function
- feature extraction
- upper and lower bounds
- density estimation
- pattern recognition
- vector quantizer
- reproducing kernel hilbert space
- learning problems
- probability density function
- decision trees
- posterior probability
- distortion measure
- computer vision
- machine learning