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Trip-Point Bit-Line Precharge Sensing Scheme for Single-Ended SRAM.

Hanwool JeongTaewon KimTaejoong SongGyu-Hong KimSeong-Ook Jung
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • single point
  • random access memory
  • protection scheme
  • real time
  • data structure
  • sensor networks
  • power consumption
  • line segments
  • sensor fusion
  • bit string