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Substrate noise modeling with dedicated CAD framework for smart power ICs.

Hao ZouYasser MoursyRamy IskanderCamillo StefanucciPietro BuccellaMaher KayalJean-Michel Sallese
Published in: ISCAS (2015)
Keyphrases
  • main contribution
  • noise level
  • data sets
  • missing data
  • modeling framework
  • real time
  • image processing
  • conceptual framework