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Thermal overstress of Cu wire under pulsed current condition.
Morgan Cason
Giuseppe Livio Gobbato
Luca Manfredi
Maurizio Nessi
Raffaele Ricci
Paolo Pulici
Claudio Maria Villa
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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sufficient conditions
infrared
probabilistic model
decision trees
electron microscopy