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Introduction to special section on high-level design, validation, and test.

Michael S. HsiaoRobert B. Jones
Published in: ACM Trans. Design Autom. Electr. Syst. (2008)
Keyphrases
  • special section
  • high level
  • low level
  • real time
  • data sets
  • decision making
  • case study
  • bayesian networks
  • test data
  • special issue
  • machine learning
  • software development