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Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device.

Zhaozhao XuDonghua LiuWei XiongJun HuWenting DuanHualun ChenWensheng QianWeiran KongShichang Zou
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • early warning
  • factors that influence
  • high impact
  • neural network
  • learning algorithm
  • artificial intelligence
  • database systems
  • multiscale
  • multiresolution