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Reliability Analysis of Multiple-Outputs Logic Circuits Based on Structure Function Approach.
Miroslav Kvassay
Elena Zaitseva
Vitaly G. Levashenko
Jozef Kostolny
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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reliability analysis
logic circuits
functional decomposition
low power
real time
image processing
high speed
multi valued
survival analysis