Login / Signup

TIES: A testability increase expert system for VLSI design.

Giacomo BuonannoFranco FummiDonatella Sciuto
Published in: J. Electron. Test. (1995)
Keyphrases
  • vlsi design
  • expert systems
  • knowledge based systems
  • knowledge engineering
  • design methodology
  • knowledge base
  • fuzzy logic
  • knowledge acquisition
  • hybrid intelligent
  • databases
  • inference engine
  • artificial intelligence